Low-cost embedded architecture for repeatable time control in electronic test stations

Abstract

Automation of electronic test stations is often constrained by manual timing control, which introduces operator-dependent variability, extended cycle durations, and increased rework. This study presents a low-cost embedded system for automated and repeatable time control in electronic test stations, designed to ensure consistent cycle termination, integrated visual feedback, and automatic power disconnection. The proposed architecture is based on a microcontroller platform implemented with widely available components to guarantee simplicity and scalability. The system was technically characterized to evaluate timing accuracy, repeatability, and actuation consistency under real industrial conditions. Experimental results obtained from 120 test cycles over a four-week period show stable cycle-to-cycle behavior, with a mean cycle time of 30.02 min, a standard deviation of 0.03 min, and a maximum absolute timing error below 0.08 min relative to the programmed duration. Operational validation showed a reduction in out-of-time events from 20% to 4%, as well as decreases in rework frequency and station downtime. The results indicate that the proposed system provides consistent and repeatable timing control at the minute scale, reducing operator-dependent variability while maintaining lower complexity and cost than conventional industrial automation platforms.